From 67c855ea6f882190d73df9d3fae0b56929fd6888 Mon Sep 17 00:00:00 2001
From: Keisuke Kuroyanagi <ksk@google.com>
Date: Fri, 4 Oct 2013 16:11:11 +0900
Subject: Check the elapsed time for decaying.

Bug: 6669677
Change-Id: I0401a4c0908c702ce65abfa5e017dd16cb1296f9
---
 .../com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java  | 4 ++--
 1 file changed, 2 insertions(+), 2 deletions(-)

(limited to 'tests/src')

diff --git a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java
index b2d31c21f..ded8eaa97 100644
--- a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java
+++ b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java
@@ -50,8 +50,8 @@ public class BinaryDictionaryDecayingTests extends AndroidTestCase {
     }
 
     private void forcePassingShortTime(final BinaryDictionary binaryDictionary) {
-        // Entries having low probability would be suppressed once in 2 GCs.
-        final int count = 2;
+        // Entries having low probability would be suppressed once in 3 GCs.
+        final int count = 3;
         for (int i = 0; i < count; i++) {
             binaryDictionary.getPropertyForTests(SET_NEEDS_TO_DECAY_FOR_TESTING_KEY);
             binaryDictionary.flushWithGC();
-- 
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