Check the elapsed time for decaying.

Bug: 6669677
Change-Id: I0401a4c0908c702ce65abfa5e017dd16cb1296f9

1 files changed, 2 insertions, 2 deletions

diff --git a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java
index b2d31c21f..ded8eaa97 100644
--- a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java
+++ b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java
@@ -50,8 +50,8 @@ public class BinaryDictionaryDecayingTests extends AndroidTestCase {
     }
 
     private void forcePassingShortTime(final BinaryDictionary binaryDictionary) {
-        // Entries having low probability would be suppressed once in 2 GCs.
-        final int count = 2;
+        // Entries having low probability would be suppressed once in 3 GCs.
+        final int count = 3;
         for (int i = 0; i < count; i++) {
             binaryDictionary.getPropertyForTests(SET_NEEDS_TO_DECAY_FOR_TESTING_KEY);
             binaryDictionary.flushWithGC();