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author | 2013-10-02 06:57:13 -0700 | |
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committer | 2013-10-02 06:57:13 -0700 | |
commit | 879ae3aa927fd13d7fa49f19d87740e5c38a52e2 (patch) | |
tree | 22945c10d02b15f0e7d95646786c44cd0e9e25af /tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java | |
parent | da4d87ff000b594ede7cdb7bcb10e9272484f467 (diff) | |
parent | 21ce9c4a89f90593e54ae29670ebd09a14533665 (diff) | |
download | latinime-879ae3aa927fd13d7fa49f19d87740e5c38a52e2.tar.gz latinime-879ae3aa927fd13d7fa49f19d87740e5c38a52e2.tar.xz latinime-879ae3aa927fd13d7fa49f19d87740e5c38a52e2.zip |
am 21ce9c4a: Merge "Stochastic decay."
* commit '21ce9c4a89f90593e54ae29670ebd09a14533665':
Stochastic decay.
Diffstat (limited to 'tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java')
-rw-r--r-- | tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java | 12 |
1 files changed, 8 insertions, 4 deletions
diff --git a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java index 8a439fc22..b2d31c21f 100644 --- a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java +++ b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java @@ -50,14 +50,18 @@ public class BinaryDictionaryDecayingTests extends AndroidTestCase { } private void forcePassingShortTime(final BinaryDictionary binaryDictionary) { - binaryDictionary.getPropertyForTests(SET_NEEDS_TO_DECAY_FOR_TESTING_KEY); - binaryDictionary.flushWithGC(); + // Entries having low probability would be suppressed once in 2 GCs. + final int count = 2; + for (int i = 0; i < count; i++) { + binaryDictionary.getPropertyForTests(SET_NEEDS_TO_DECAY_FOR_TESTING_KEY); + binaryDictionary.flushWithGC(); + } } private void forcePassingLongTime(final BinaryDictionary binaryDictionary) { // Currently, probabilities are decayed when GC is run. All entries that have never been - // typed in 32 GCs are removed. - final int count = 32; + // typed in 128 GCs would be removed. + final int count = 128; for (int i = 0; i < count; i++) { binaryDictionary.getPropertyForTests(SET_NEEDS_TO_DECAY_FOR_TESTING_KEY); binaryDictionary.flushWithGC(); |