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| author |   Keisuke Kuroyanagi <ksk@google.com> | 2013-10-04 07:16:16 +0000 |
|---|---|---|
| committer |   Android (Google) Code Review <android-gerrit@google.com> | 2013-10-04 07:16:17 +0000 |
| commit | 3e5f4b53b0b51288afdd921052974c6740a5aa6b (patch) | |
| tree | 4419ccf2e49bcd55ab3be6ec0b4b1a61767c1eb1 /tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java | |
| parent | 14d31d464037c31e7f7d382a8a86f6acf4694b06 (diff) | |
| parent | 67c855ea6f882190d73df9d3fae0b56929fd6888 (diff) | |
| download | latinime-3e5f4b53b0b51288afdd921052974c6740a5aa6b.tar.gz latinime-3e5f4b53b0b51288afdd921052974c6740a5aa6b.tar.xz latinime-3e5f4b53b0b51288afdd921052974c6740a5aa6b.zip | |
Merge "Check the elapsed time for decaying."
Diffstat (limited to 'tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java')
| -rw-r--r-- | tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java | 4 |
1 files changed, 2 insertions, 2 deletions
diff --git a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java index b2d31c21f..ded8eaa97 100644 --- a/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java +++ b/tests/src/com/android/inputmethod/latin/BinaryDictionaryDecayingTests.java @@ -50,8 +50,8 @@ public class BinaryDictionaryDecayingTests extends AndroidTestCase { } private void forcePassingShortTime(final BinaryDictionary binaryDictionary) { - // Entries having low probability would be suppressed once in 2 GCs. - final int count = 2; + // Entries having low probability would be suppressed once in 3 GCs. + final int count = 3; for (int i = 0; i < count; i++) { binaryDictionary.getPropertyForTests(SET_NEEDS_TO_DECAY_FOR_TESTING_KEY); binaryDictionary.flushWithGC(); |